EDN

ARM adds VLSI test at Indian design center

BENGALURU, India — ARM has set up a VLSI test lab at its design center here to analyze intellectual-property libraries and ARM physical IP, so as to correlate design to silicon behavior. Such activity ...
TechRepublic

Reordering Algorithm for Minimizing Test Power in VLSI Circuits

Power consumption has become a crucial concern in Built-In Self-Test (BIST) due to the switching activity in the Circuit Under-Test (CUT). In this paper, the authors present a novel method which aims ...
techtimes

Advancements in VLSI Design and Emulation: A Deep Dive with VLSI Expert Kunal Doshi

Imagine a world where the chips powering your smartphones, computers, and even cars are designed and tested with unparalleled precision and speed. Welcome to the realm of Very Large Scale Integration ...
EDN

Weak memory market impacts test probe card market, VLSI Research says

Weakness in the semiconductor industry pushed sales of IC wafer testing probe cards down to half of the five-year historic average, or 13.9%, in 2007 according to Santa Clara, Calif.-based market ...
AZOM

A Closer Look at Semiconductor Test Equipment

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...